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Volumn 39, Issue SUPPL.1, 2013, Pages
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Structural and electrical properties of sol-gel-derived Al-doped bismuth ferrite thin films
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Author keywords
Al doped; BiFeO3; Leakage current; Thin films
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Indexed keywords
AL-DOPED;
ANNEALING TEMPERATURES;
BIFEO3;
BISMUTH FERRITES;
CROSS-SECTION MORPHOLOGY;
CRYSTALLINE STRUCTURE;
SCANNING ELECTRON MICROSCOPE;
STRUCTURAL AND ELECTRICAL PROPERTIES;
ELECTRIC FIELDS;
ELECTRIC PROPERTIES;
LEAKAGE CURRENTS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR DOPING;
SOL-GEL PROCESS;
SOL-GELS;
THIN FILMS;
X RAY DIFFRACTION;
ALUMINUM;
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EID: 84875703404
PISSN: 02728842
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ceramint.2012.10.114 Document Type: Conference Paper |
Times cited : (24)
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References (19)
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