Antireflection properties of graphene layers on planar and textured silicon surfaces

Nanotechnology

Volumn 24, Issue 16, 2013, Pages

  Kumar, Rakesh ^a   Sharma, A K ^a   Bhatnagar, Mehar ^a   Mehta, B R ^a   Rath, Shyama ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b UNIVERSITY OF DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE-DIFFERENCE TIME-DOMAIN CALCULATIONS; HIGH TRANSMITTANCE; MICROWAVE PLASMA ENHANCED CHEMICAL VAPOR DEPOSITIONS; POLISHED SILICONS; REFLECTANCE VALUES; SILICON SURFACES; THEORETICAL AND EXPERIMENTAL; WAVELENGTH RANGES;

ANTIREFLECTION COATINGS; COATINGS; DEPOSITS; FINITE DIFFERENCE TIME DOMAIN METHOD; MONOLAYERS; REFLECTION; SILICON; SILICON OXIDES; TIME DOMAIN ANALYSIS;

GRAPHENE;

EID: 84875671836     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/16/165402     Document Type: Article

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