Si-Cu thin film electrode with kirkendall voids structure for lithium-ion batteries

Journal of the Electrochemical Society

Volumn 159, Issue 12, 2012, Pages

  He, Yu ^a   Wang, Yanhong ^a   Yu, Xiqian ^a   Li, Hong ^a   Huang, Xuejie ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; CYCLED ELECTRODE; ENERGY DISPERSIVE X RAY SPECTROSCOPY; INACTIVE MATRIX; KIRKENDALL EFFECTS; LITHIUM-ION BATTERY; THIN-FILM ELECTRODE; VOLUME EXPANSION;

ELECTRODES; RAMAN SPECTROSCOPY; SILICIDES; SILICON; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

ANNEALING;

EID: 84875515707     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/2.073212jes     Document Type: Article

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