Large-scale uniform Ag-NW tip array with enriched sub-10-nm gaps as SERS substrate for rapid determination of trace PCB77

Applied Surface Science

Volumn 271, Issue , 2013, Pages 125-130

  Xu, Wei ^a   Meng, Guowen ^a,b   Huang, Qing ^c   Hu, Xiaoye ^a   Huang, Zhulin ^a   Tang, Haibin ^a   Zhang, Junxi ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Hot spots; Polychlorinated biphenyls; Sub 10 nm; Surface enhanced Raman scattering; Trace determination

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ANODIC OXIDATION; ELECTRODES; FILM GROWTH; GOLD COATINGS; ION BEAMS; MOLECULES; ORGANIC POLLUTANTS; POLYCHLORINATED BIPHENYLS; RAMAN SCATTERING; SILVER; SURFACE SCATTERING; THIN FILMS; TRACE ANALYSIS;

ANODIC ALUMINUM OXIDE; ELECTRODEPOSITION GROWTH; HOT SPOT; POLYCHLORINATED BIPHENYL (PCBS); SILVER MIRROR REACTIONS; SUB-10-NM; SURFACE ENHANCED RAMAN SCATTERING (SERS); TRACE DETERMINATION;

SUBSTRATES;

EID: 84875372255     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2013.01.144     Document Type: Article

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