Dual wavelength full field imaging in low coherence digital holographic microscopy

Optics Express

Volumn 19, Issue 24, 2011, Pages 24005-24022

  Monemhaghdoust, Zahra ^a   Montfort, Frédéric ^b   Emery, Yves ^b   Depeursinge, Christian ^a,b   Moser, Christophe ^a  

^a EPFL   (Switzerland)

^b Lyncee Tec SA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION;

DIGITAL HOLOGRAPHIC MICROSCOPY; DUAL WAVELENGTH; FULL-FIELD IMAGING; IN-LINE; LOW-COHERENCE; OBJECT BEAM; OFF-AXIS; PROPAGATION DIRECTION; REFERENCE BEAMS; SET-UPS; TWO WAVELENGTH; UNAMBIGUOUS RANGE;

DIFFRACTIVE OPTICAL ELEMENTS;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; HOLOGRAPHY; IMAGE ENHANCEMENT; INSTRUMENTATION; MICROSCOPY; OPTICAL COHERENCE TOMOGRAPHY; OPTICAL INSTRUMENTATION; REFRACTOMETRY; SIGNAL PROCESSING;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; HOLOGRAPHY; IMAGE ENHANCEMENT; LENSES; MICROSCOPY; REFRACTOMETRY; SIGNAL PROCESSING, COMPUTER-ASSISTED; TOMOGRAPHY, OPTICAL COHERENCE;

EID: 82055206533     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.024005     Document Type: Article

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