Decoupling of geometric thickness and refractive index in quantitative phase microscopy

Optics Letters

Volumn 38, Issue 6, 2013, Pages 1007-1009

  Cardenas, Nelson ^a   Mohanty, Samarendra ^a  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHYSICAL THICKNESS; PRIORI KNOWLEDGE; QUANTITATIVE PHASE IMAGING; QUANTITATIVE PHASE MICROSCOPIES;

OPTICS; OPTOELECTRONIC DEVICES;

REFRACTIVE INDEX;

MICROSPHERE; POLYSTYRENE DERIVATIVE;

ARTICLE; CHEMISTRY; LIGHT RELATED PHENOMENA; METHODOLOGY; MICROSCOPY;

MICROSCOPY; MICROSPHERES; OPTICAL PROCESSES; POLYSTYRENES;

EID: 84875194235     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.38.001007     Document Type: Article

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