Accurate measurement of refraction and dispersion of a solid by a double-layer interferometer

Applied Optics

Volumn 36, Issue 4, 1997, Pages 779-785

  Nassif, A Y ^a  

^a Ain Shams University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000887184     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.000779     Document Type: Article

References (34)

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