Electron beam induced nanostructures and band gap tuning of ZnO thin films

Journal of Alloys and Compounds

Volumn 563, Issue , 2013, Pages 280-284

  Siraj, K ^a   Javaid, Kashif ^a,b   Pedarnig, J D ^c   Bodea, M A ^c   Naseem, S ^d  

^a UNIVERSITY OF ENGINEERING AND TECHNOLOGY   (Pakistan)

^b GOVERNMENT COLLEGE UNIVERSITY   (Pakistan)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^d UNIVERSITY OF THE PUNJAB   (Pakistan)

Author keywords

Electron irradiation; Nanostructures; Optical properties; ZnO thin films

Indexed keywords

ATOMIC FORCE MICROGRAPHS; ATOMIC FORCE MICROSCOPE (AFM); BROAD ABSORPTIONS; HIGH-ENERGY ELECTRON; KRF EXCIMER LASER; NANOSCALE STRUCTURE; OPTICAL BAND GAP ENERGY; ZNO THIN FILM;

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; ELECTRON BEAMS; ELECTRON IRRADIATION; EXCIMER LASERS; METALLIC FILMS; NANOSTRUCTURES; OPTICAL BAND GAPS; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; ZINC OXIDE;

OPTICAL FILMS;

EID: 84875079419     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2013.02.040     Document Type: Article

References (18)

1. C. Leroy, and P. Rancoita Rep. Prog. Phys. 70 2007 493 625
2. S. Subramanian, M. Balaji, P.C. Lekha, G. Sanjeev, E. Subramanian, and D. Pathinettam Padiyan Rad. Phys. Chem. 79 2010 1127 1131
3. Y.J. Jo, C.H. Hong, and J.S. Kwak Curr. Appl. Phys. 11 2011 S143 S146
4. J.S. Bhat, K.I. Maddani, A.M. Karguppikar, and S. Ganesh Nucl. Instrum. Meth. Phys. Res. B: Beam Inter. Mater. Atoms 258 2007 369 374
5. K. Siraj, Ph.D. thesis, Johannes Kepler University Linz, Austria, 2007.
6. S.S. Tinchev J. Optoelectron. Adv. Mater. 7 2005 1253
7. K. Siraj, M. Khaleeq-ur-Rahman, M.S. Rafique, and T. Nawaz Nucl. Instrum. Meth. Phys. Res.B: Beam Inter. Mater. Atoms 269 2011 53 56
8. E. Yun, J.W. Jung, B.C. Lee, and M. Jung Surf. Coat. Technol. 205 2011 5130 5134
9. A.K. Srivastava Mater. Lett. 62 2008 4296 4298
10. E. Yun, J.W. Jung, Y.H. Han, M. Kim, and B.C. Lee J. Appl. Phys. 105 2009 123509
11. L.S. Vlasenko, and G.D. Watkins Phys. Rev. B 71 2005 125210
12. R. Xie, T. Sekiguchi, T. Ishigaki, N. Ohashi, D. Li, D. Yang, B. Liu, and Y. Bando Appl. Phys. Lett. 88 2006 134103
13. A. Vlad, S. Yakunin, E. Kolmhofer, V. Kolotovska, L. Muresan, A. Sonnleitner, D. Bäuerle, and J.D. Pedarnig Thin Solid Films 518 2009 1350 1354
14. http://physics.nist.gov.
15. Tung.-Po. Lin IBM J. Res. Develop. 11 1967 527 536
16. A. Karuppasamy, and A. Subrahmanyam Mater. Lett. 61 2007 1256 1259
17. H. Fujiwara Spectroscopic Ellipsometry Principles and Applications 2007 John Wiley & Sons Ltd. England
18. C.H. Hong, Y.J. Jo, H.A. Kim, I.-H. Lee, and J.S. Kwak Thin Solid Films 519 2011 6829 6833