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Volumn 62, Issue 1, 2013, Pages 116-126

An adaptive self-configuration scheme for severity invariant machine fault diagnosis

Author keywords

Adaptive fault diagnosis; machine health monitoring; optimal wavelet parameterization; severity invariant diagnosis

Indexed keywords

ABNORMALITY DETECTION; COMPARATIVE STUDIES; FAULT DIAGNOSIS SCHEMES; MACHINE FAULT DIAGNOSIS; MACHINE HEALTH MONITORING; OPTIMAL WAVELETS; PERFORMANCE DEGRADATION; TRAINING AND TESTING;

EID: 84874996786     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2012.2222612     Document Type: Article
Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.