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Volumn 769, Issue , 2013, Pages 49-55

Bismuth-dispersed xerogel-based composite films for trace Pb(II) and Cd(II) voltammetric determination

Author keywords

Bismuth precursors; Bismuth modified xerogel; Determination of Cd(II) and Pb(II) ions; Stripping voltammetry

Indexed keywords

ANODIC STRIPPING VOLTAMMETRY; BISMUTH PRECURSORS; ELECTROCHEMICAL METHODS; GLASSY CARBON ELECTRODES; OPTIMUM CONDITIONS; POTENTIAL INTERFERENCES; STRIPPING VOLTAMMETRY; VOLTAMMETRIC DETERMINATION;

EID: 84874984813     PISSN: 00032670     EISSN: 18734324     Source Type: Journal    
DOI: 10.1016/j.aca.2013.01.040     Document Type: Article
Times cited : (64)

References (39)
  • 14
    • 67649999850 scopus 로고    scopus 로고
    • Lab-on-a-chip sensor for assessment of manganese exposure
    • Jothimuthu P., Haynes E., Papautsky I. Lab-on-a-chip sensor for assessment of manganese exposure. Sensors, 2008 IEEE 2008, 219-222.
    • (2008) Sensors, 2008 IEEE , pp. 219-222
    • Jothimuthu, P.1    Haynes, E.2    Papautsky, I.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.