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Journal of Applied Physics

Volumn 113, Issue 8, 2013, Pages

Continuous-film vs. device-level ferromagnetic resonance in magnetic tunnel junction thin films

(3) Evarts, Eric R a Pufall, Matthew R a Rippard, William H a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH LIMITATION; DEMAGNETIZING FIELD; EFFECTIVE MAGNETIZATIONS; FERROMAGNETIC RESONANCE MEASUREMENTS; IN-PLANE MAGNETIZATION; INHOMOGENEOUS BROADENING; MAGNETIC TUNNEL JUNCTION; VECTOR NETWORK ANALYZERS;

ELECTRIC NETWORK ANALYZERS; LEVEL MEASUREMENT; MAGNETIC DEVICES; MAGNETIZATION; THIN FILMS;

FERROMAGNETIC RESONANCE;

EID: 84874925077 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4793589 Document Type: Article

Times cited : (9)

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