Intrinsic damping and intentional ferromagnetic resonance broadening in thin permalloy films

Journal of Applied Physics

Volumn 93, Issue 10 2, 2003, Pages 6903-6905

  Twisselmann, D J ^a   McMichael, R D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIZATION; NICKEL COMPOUNDS; SUBSTRATES; THIN FILMS;

INTRINSIC DAMPING;

FERROMAGNETIC MATERIALS;

EID: 0038210254     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1543884     Document Type: Conference Paper

References (21)

1. M. Sparks, Ferromagnetic Relaxation Theory, Advanced Physics Monograph Series (McGraw-Hill, New York, 1964).
2. C. E. Patton, in Magnetic Oxides, edited by D. J. Craik (Wiley, London, 1975), Chap. 10, pp. 575-648.
3. C. W. Haas and H. B. Callen, in Magnetism (Academic, New York, 1963), Vol. 1, Chap. 10, pp. 480-497.
4. V. Kambersky, Can. J. Phys. 48, 2906 (1970).
5. V. Korenman and R. E. Prange, Phys. Rev. B 6, 2769 (1972).
6. L. Berger, J. Phys. Chem. Solids 38, 1321 (1977).
7. V. Safonov and H. N. Bertram, Phys. Rev. B 61, R14893 (2000).
8. V. L. Safonov and H. N. Bertram, preprint cond-mat/0207721 2002.
9. V. L. Safonov, J. Appl. Phys. 91, 8653 (2002).
10. N. Smith, J. Appl. Phys. 92, 3877 (2002).
11. Z. Celinski and B. Heinrich, J. Appl. Phys. 70, 5935 (1991).
12. R. Karim, S. D. Ball, J. R. Truesdon, and C. E. Patton, J. Appl. Phys. 73, 4512 (1993).
13. W. Platow, A. N. Anisimov, G. L. Dunifer, M. Farle, and K. Baberschke, Phys. Rev. B 58, 5611 (1998).
14. R. Urban, B. Heinrich, G. Woltersdorf, K. Ajdari, K. Myrtle, J. F. Cochran, and E. Rozenberg, Phys. Rev. B 65, 020402 (2002).
15. V. Kambersky and C. E. Patton, Phys. Rev. B 11, 2668 (1975).
16. C. E. Patton, J. Appl. Phys. 39, 3060 (1968).
17. C. E. Patton, Z. Frait, and C. H. Wilts, J. Appl. Phys. 46, 5002 (1975).
18. C. Hou, J. Chen, M. T. Kief, Z. Gao, S. Mao, and T. Pokhil, Appl. Phys. Lett. 78, 237 (2001).
19. R. D. McMichael, M. D. Stiles, P. J. Chen, and W. F. Egelhoff, Jr., J. Appl. Phys. 83, 7037 (1998).
20. R. Arias and D. L. Mills, Phys. Rev. B 60, 7395 (1999).
21. R. D. McMichael, D. J. Twisselmann, J. E. Bonevich, A. P. Chen, W. F. Egelhoff, and S. E. Russek, J. Appl. Phys. 91, 8647 (2002).