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Volumn 7, Issue 3, 2013, Pages 177-179
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Look fast: Crystallization of conjugated molecules during solution shearing probed in-situ and in real time by X-ray scattering
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Author keywords
Conjugated molecules; Crystallization; Organic semiconductors; Solution processing; X ray scattering
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Indexed keywords
CASTING PARAMETERS;
CONJUGATED MOLECULES;
CRYSTAL NUCLEATION AND GROWTHS;
DISSOLVED MATERIALS;
GRAZING INCIDENCE;
HIGH MOBILITY;
MICRO BEAMS;
MOLECULAR THIN FILM;
ORGANIC THIN FILM TRANSISTORS;
REAL TIME;
SOLUTION SHEARING;
SOLUTION-PROCESSING;
WIDE ANGLE X-RAY SCATTERING;
COATINGS;
CRYSTALLIZATION;
SEMICONDUCTING ORGANIC COMPOUNDS;
SHEARING;
THIN FILM TRANSISTORS;
THIN FILMS;
X RAY SCATTERING;
X RAYS;
MOLECULES;
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EID: 84874783185
PISSN: 18626254
EISSN: 18626270
Source Type: Journal
DOI: 10.1002/pssr.201206507 Document Type: Article |
Times cited : (74)
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References (19)
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