The effects of X-ray irradiation and temperature on the formation and stability of chemical species on enargite surfaces during XPS

Minerals Engineering

Volumn 45, Issue , 2013, Pages 59-66

  Plackowski, Chris ^a   Hampton, Marc A ^a   Nguyen, Anh V ^a   Bruckard, Warren J ^b  

^a UNIVERSITY OF QUEENSLAND   (Australia)

^b CSIRO   (Australia)

Author keywords

Arsenic; Copper; Oxidation; Sulfide; Sulfur; Surface

Indexed keywords

CHEMICAL SPECIES; CONSISTENT ANALYSIS; ENARGITE; EXPOSED TO; PHOTO-REDUCTION; PHOTOELECTRON SIGNALS; POLISHED SURFACES; RATE OF CHANGE; RELATIVE CONCENTRATION; SAMPLE COOLING; SULFIDE; SURFACE LAYERS; SURFACE OXYGEN; SURFACE SPECIES; X RAY IRRADIATION; X RAY RADIATION; X-RAY EXPOSURE;

ARSENIC; BINDING ENERGY; CHEMICAL STABILITY; COPPER; ELECTROCHEMICAL OXIDATION; IRRADIATION; OXIDATION; PHOTOELECTRONS; SULFUR; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

RADIATION EFFECTS;

EID: 84874678958     PISSN: 08926875     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mineng.2013.01.009     Document Type: Article

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