XPS and XAES analysis of copper, arsenic and sulfur chemical state in enargites

Surface and Interface Analysis

Volumn 38, Issue 5, 2006, Pages 922-930

  Fantauzzi, M ^a   Atzei, D ^a   Elsener, B ^a   Lattanzi, P ^a   Rossi, A ^a  

^a UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

Auger parameter; Chemical state plot; Enargite; X ray excited Auger electron spectroscopy (XAES); X ray photoelectron spectroscopy (XPS)

Indexed keywords

BINDING ENERGY; COMPOSITION; DISSOLUTION; OXIDATION; OXIDES; PARAMETER ESTIMATION; TOXIC MATERIALS; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER PARAMETERS; CHEMICAL STATE PLOTS; ENARGITES; INTENSITY DATA; X-RAY EXCITED AUGER ELECTRON SPECTROSCOPY (XAES);

COPPER COMPOUNDS;

EID: 33646537824     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2348     Document Type: Article

References (29)

1. Arribas A. Miner. Assoc. Can. Short Course 1995; 23: 419.
2. Nesbitt HW, Muir IJ. Geochim. Cosmochim. Aca 1994; 58: 4667.
3. Nesbitt HW, Muir IJ, Pratt R. Geochim. Cosmochim. Acta 1995; 59: 1773.
4. England KER, Pattrick RAD, Vaughan DJ. Mineral. Mag. 1999; 63: 559.
5. Fullston D, Fornasiero D, Ralston J. Langmuir 1999; 15: 4530.
6. Da Pelo S. Mineralogia e geochimica ambientale di aree mineraric attive c dismesse, PhD thesis, University of Cagliari 1998, English abstract in Plinius 1999; 21: 70.
7. Velasquez P, Ramos-Barrado JR, Leinen D. Surf. Interface Anal. 2002; 34: 280.
8. Pratt A. Surf. Interface Anal. 2004; 36: 654.
9. Vinals J, Roca A, Hernandez MC, Benavente O. Hydrometallurgy 2003; 68: 183.
10. Asbjörnsson J, Kelsall GH, Pattrick RAD, Vaughan DJ, Wincott PL, Hope GA. J. Electrochem. Soc. 2004; 151: E250.
11. Rossi A, Atzei D, Da Pelo S, Frau F, Lattanzi P, England KER, Vaughan DJ. Surf. Interface Anal. 2001; 31: 465.
12. Rossi A, Atzei D, Elsener B, Da Pelo S, Frau F, Lattanzi P, Wincott PL, Vaughan DJ. In Water-Rock Interaction, vol. 1, Cidu R (ed.). A.A. Balkema Publishers: Rotterdam, 2001; 427.
13. Perry DL, Taylor JA, Wagner CD. X-ray induced photoelectron and auger spectroscopy. In Instrumental Surface Analysis of Geological Materials, Perry DL (ed.). VCH Publishers: Weinheim, 1990; 45.
14. Wagner CD, Joshi A. J. Electron Spectrosc. Relat. Phenom. 1991; 47: 283.
15. Seah MP. Surf. Interface Anal. 1993; 20: 243.
16. Rossi A, Elsener B. Surf. Interface Anal. 1992; 18: 499.
17. Seah MP. Surf. Interface Anal. 1989; 14: 488.
18. Frost DC, Ishitani A, McDowell CA. Mol. Phys. 1972; 24: 861.
19. Moretti G. J. Electron Spectrosc. Relat. Phenom. 1998; 95: 95.
20. Atzei D, Da Pelo S, Elsener B, Fantauzzi M, Frau F, Lattanzi P, Rossi A. Annali di Chimica 2003; 93: 11.
21. Data compiled and evaluated by Charles DW, Alexander VN, Anna KV, Juanita WA, Cedric JP, John RR Jr. NIST X-ray Photoelectron Spectroscopy Database, http://srdata.nist.gov/xps/ [2005].
22. De Filippo D, Rossi A, Rossi G, Trois P. Proceedings of the VIIIth International Biotechnology Symposium, vol. 2, Durand G, Bobichon L, Florent J (eds). Societé Francaise de Microbiologie: Paris, France, 1988; 1131, Paris, 17-22. July 1988.
23. Nakai I, Sugitani Y, Nagashima K. J. Inorg. Nucl. Chem. 1978; 40: 798.
24. Chawla SK, Sankarraman N, Peyer JH. J. Electron Spectrosc. Relat. Phenom. 1992; 61: 1.
25. Wagner CD. Anal. Chem. 1972; 44: 967.
26. Wagner CD. Faraday Discuss. Chem. Soc. 1975; 60: 291.
27. Wagner CD, Gale LH, Raymond RH. Anal. Chem. 1979; 51: 466.
28. Bahl MK, Woodall RO, Watson RL, Irgolic KJ. J. Chem. Phys. 1976; 64: 1210.
29. Moulder JF, Stickle WF, Sobol PE, Bomben KD. Handbook of X Ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data. Physical Electronics Division: Eden Prairie, MN, 1995; ISBN: 096 481 241X.