A practical approach to 3D scanning in the presence of interreflections, subsurface scattering and defocus

International Journal of Computer Vision

Volumn 102, Issue 1-3, 2013, Pages 33-55

  Gupta, Mohit ^a   Agrawal, Amit ^b   Veeraraghavan, Ashok ^c   Narasimhan, Srinivasa G ^d  

^a Fu Foundation School of Engineering and Applied Science   (United States)

^b MITSUBISHI ELECTRIC RESEARCH LABORATORIES   (United States)

^c Rice University   (United States)

^d CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Defocus; Global illumination; Indirect illumination; Interreflections; Light transport; Projectors; Structured light 3D scanning; Subsurface scattering

Indexed keywords

3D-SCANNING; DEFOCUS; GLOBAL ILLUMINATION; INDIRECT ILLUMINATION; INTERREFLECTIONS; LIGHT TRANSPORT; SUBSURFACE SCATTERING;

ERRORS; IMAGING SYSTEMS; OPTICAL PROJECTORS; SCANNING; SCATTERING; THREE DIMENSIONAL COMPUTER GRAPHICS;

REFLECTION;

EID: 84874657487     PISSN: 09205691     EISSN: 15731405     Source Type: Journal    
DOI: 10.1007/s11263-012-0554-3     Document Type: Article

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