Dense 3-D surface acquisition by structured light using off-the-shelf components

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4309, Issue , 2001, Pages 220-231

  Guhring J ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

3 D Measurement System; Calibration; Inspection; Line Shift Processing; Structured Light

Indexed keywords

CAMERAS; LIQUID CRYSTAL DISPLAYS; OPTICAL PROJECTORS; OPTICAL SENSORS;

LINE SHIFT PROCESSING;

PROJECTION SYSTEMS;

EID: 0035052156     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.410877     Document Type: Conference Paper

References (10)

1. Measuring surfaces spacecoded by a laser-projected dot matrix
2. Fast and robust range data acquisition in a low-cost environment
3. Data processing and calibration of a cross-pattern stripe projector
4. Dichte dreidimensionale Oberflächenerfassung mittels Streifenprojektion unter Verwendung von Standardkomponenten
5. Calibration, data consistency and model acquisition with laser stripers
6. Real-time numerical peak detector
7. Better optical triangulation through space-time analysis
8. Photogrammetric calibration and accuracy evaluation of a cross-pattern stripe projector
9. Digital camera self-calibration