Modulated phase-shifting for 3D scanning

26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR

Volumn , Issue , 2008, Pages

  Chen, Tongbo ^a   Seidel, Hans Peter ^a   Lensch, Hendrik P A ^a  

^a MAX PLANCK INSTITUTE FOR INFORMATICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

3D SCANNING; CLEAN UP; COMPLEX OBJECTS; GLOBAL ILLUMINATION; HIGH FREQUENCIES; INTER-REFLECTIONS; LIGHT TRANSPORT; MODULATED PHASE; MODULATED SIGNALS; ONE-PASS; OPTICAL-; PHASE-SHIFTING; SEPARATION METHODS; SUBSURFACE SCATTERING; SURFACE REFLECTIONS; VOLUMETRIC SCATTERING;

ARTIFICIAL INTELLIGENCE; CHLORINE COMPOUNDS; COMPUTER VISION; FEATURE EXTRACTION; IMAGE PROCESSING; IMAGING TECHNIQUES; ISOMERS; LIGHT REFLECTION; MODULATION; OPTICAL ENGINEERING; PATTERN RECOGNITION; PHASE SEPARATION; PHOTOGRAPHY; REFLECTION; SCATTERING; SEPARATION;

SCANNING;

EID: 51949091939     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2008.4587836     Document Type: Conference Paper

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