Supercapacitive evaluation of soft chemically deposited α-Sm 2S3 thin films

Journal of Power Sources

Volumn 234, Issue , 2013, Pages 107-110

  Kumbhar, V S ^a   Jagadale, A D ^a   Lokhande, C D ^a  

^a SHIVAJI UNIVERSITY   (India)

Author keywords

Sm2S3; Cyclic voltammetry; Nanoporous; Scanning electron microscopy; Supercapacitor; Thin films

Indexed keywords

EIS STUDIES; ELECTROCHEMICAL BEHAVIOUR; ELECTRODE STABILITY; GALVANOSTATIC CHARGE DISCHARGES; INTERFACIAL CAPACITANCE; MORPHOLOGICAL STUDY; NANO-POROUS; PROPYLENE CARBONATE; SCAN RATES; SOFT CHEMICALS; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS; SUPER CAPACITOR; SUPERCAPACITOR ELECTRODES; SYNTHESISED;

CYCLIC VOLTAMMETRY; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; FILM GROWTH; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

ELECTROLYTIC CAPACITORS;

EID: 84874590728     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2013.01.078     Document Type: Article

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