High nonlinear figure-of-merit amorphous silicon waveguides

Optics Express

Volumn 21, Issue 4, 2013, Pages 3932-3940

  Matres, J ^a   Ballesteros, G C ^a   Gautier, P ^b   Fedeli J M ^b   Marti J ^a   Oton, C J ^a,c  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

^b CEA LETI   (France)

^c SCUOLA SUPERIORE SANT ANNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS;

AMORPHOUS SILICON WAVEGUIDES; FIGURE OF MERITS; FREE-CARRIER EFFECTS; HIGH NONLINEAR; IMAGINARY PARTS; NON-LINEAR RESPONSE; NONLINEAR COEFFICIENT; NONLINEAR LOSS; PEAK POWER; REAL PART; SILICON-ON-INSULATORS; TIME RESOLVED MEASUREMENT; TWO PHOTON ABSORPTION;

OPTICS;

SILICON;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; NONLINEAR SYSTEM; REFRACTOMETRY; SURFACE PLASMON RESONANCE; THEORETICAL MODEL; DEVICE FAILURE ANALYSIS; DEVICES;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MODELS, THEORETICAL; NONLINEAR DYNAMICS; REFRACTOMETRY; SILICON; SURFACE PLASMON RESONANCE;

EID: 84874514356     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.003932     Document Type: Article

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