Highly resolved spatial and temporal photoemission analysis of integrated circuits

Measurement Science and Technology

Volumn 24, Issue 3, 2013, Pages

  Schlösser, Alexander ^a   Dietz, Enrico ^a   Frohmann, Sven ^a   Orlic, Susanna ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

failure analysis; hot carrier luminescence; integrated circuit analysis; photoemission

Indexed keywords

FAILURE ANALYSIS; HOT CARRIERS; INTEGRATED CIRCUITS; LIGHT; OPTICAL SYSTEMS; PHOTONS;

ANALYSIS SYSTEM; DETECTION MODULES; FEATURE SIZES; OPTICAL ANALYSIS; PHOTOEMISSION ANALYSIS; REAL-WORLD; SPATIAL AND TEMPORAL RESOLUTIONS; SWITCHING TRANSISTOR; SYSTEM CAPABILITIES;

PHOTOEMISSION;

EID: 84874330103     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/24/3/035102     Document Type: Article

References (8)

1. Kocher P, Jaffe J and Jun B 1999 Advances in Cryptology - CRYPTO'99 (Lecture Notes in Computer Science vol 1666) pp 388-97
2. Ferrigno J and Hlavac M 2008 Inf. Secur. IET 2 94-8
3. Newman R 1955 Phys. Rev. 100 700-3
4. Bude J, Sano N and Yoshii A 1992 Phys. Rev. B 45 5848-56
5. Villa S, Lacaita A L and Pacelli A 1995 Phys. Rev. B 52 10993-9
6. Pavesi M, Rigolli P L, Manfredi M, Palestri P and Selmi L 2002 Phys. Rev. B 65 195209
7. Vandevender A P and Kwiat P G 2004 J. Mod. Opt. 51 1433-45
8. Goltsman G, Okunev O, Chulkova G, Lipatov A, Dzardanov A, Smirnov K, Semenov A, Voronov B, Williams C and Sobolewski R 2001 IEEE Trans. Appl. Supercond. 11 574-7 (Pubitemid 32513201)