XRD and XAS structural study of CuAlO2 under high pressure

Journal of Physics Condensed Matter

Volumn 25, Issue 11, 2013, Pages

  Pellicer Porres, J ^a   Segura, A ^a   Ferrer Roca, C ^a   Polian, A ^b   Munsch, P ^b   Kim, D ^c  

^a UNIVERSITY OF VALENCIA   (Spain)

^b CNRS   (France)

^c Pukyong National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC COMPRESSION; CHEMICAL TREND; CRYSTAL BREAKING; CU K-EDGE; DELAFOSSITE STRUCTURE; EXAFS; HIGH PRESSURE; HIGH-PRESSURE POLYMORPH; INTERNAL PARAMETERS; IRREVERSIBLE PHASE; POLARIZATION DEPENDENCE; PRECURSOR EFFECT; STRUCTURAL STUDIES; TRIVALENT CATIONS; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XRD;

COPPER COMPOUNDS; EXPERIMENTS; SEMICONDUCTING BISMUTH COMPOUNDS; X RAY ABSORPTION SPECTROSCOPY; X RAY DIFFRACTION;

ANISOTROPY;

EID: 84874283122     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/25/11/115406     Document Type: Article

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