Direct quantification of ordering at a solid-liquid interface using aberration corrected transmission electron microscopy

Physical Review Letters

Volumn 110, Issue 8, 2013, Pages

  Gandman, Maria ^a   Kauffmann, Yaron ^a   Koch, Christoph T ^b   Kaplan, Wayne D ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATION-CORRECTED; DEGREE OF ORDER; DEGREE OF ORDERING; DELOCALIZATIONS; DENSITY PERTURBATION; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; SOLID-LIQUID INTERFACES;

IN SITU PROCESSING; SAPPHIRE; TRANSMISSION ELECTRON MICROSCOPY;

LIQUIDS;

ALUMINUM; ALUMINUM OXIDE;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; METHODOLOGY; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM; ALUMINUM OXIDE; CRYSTALLIZATION; MICROSCOPY, ELECTRON, TRANSMISSION; SURFACE PROPERTIES;

EID: 84874162033     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.110.086106     Document Type: Article

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