Nanoparticles charge response from electrostatic force microscopy

Applied Physics Letters

Volumn 102, Issue 5, 2013, Pages

  Mottaghizadeh, A ^a   Lang, P L ^a,b   Cui, L M ^a,c   Lesueur, J ^a   Li, J ^c   Zheng, D N ^c   Rebuttini, V ^d   Pinna, N ^d,e   Zimmers, A ^a   Aubin, H ^a  

^a CNRS   (France)

^b BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

^c INSTITUTE OF PHYSICS   (China)

^d UNIVERSITY OF AVEIRO   (Portugal)

^e HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

3D MAPS; DIELECTRIC COEFFICIENT; ELECTROSTATIC FORCE MICROSCOPY; NANO-OBJECTS; NANOMATERIAL; QUANTUM CAPACITANCE;

CAPACITANCE; ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC FORCE; NANOPARTICLES; NANOSTRUCTURED MATERIALS; SIGNAL PROCESSING;

MAGNETITE NANOPARTICLES;

EID: 84874095690     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4790587     Document Type: Article

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