Structural and optical properties of Cr doped ZnO crystalline thin films deposited by reactive electron beam evaporation technique

Progress in Natural Science: Materials International

Volumn 23, Issue 1, 2013, Pages 64-69

  Iqbal, Amjid ^a   Mahmood, Arshad ^a   Muhammad Khan, Taj ^a   Ahmed, Ejaz ^b  

^a National Institute of Laser and Optronics (NILOP)   (Pakistan)

^b PAKISTAN INSTITUTE OF NUCLEAR SCIENCE AND TECHNOLOGY   (Pakistan)

Author keywords

Cr doping; Ellipsometry; Optical constants; Roughness; Thin film; ZnO thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON BEAMS; ELLIPSOMETRY; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY GAP; EVAPORATION; GLASS SUBSTRATES; II-VI SEMICONDUCTORS; METALLIC FILMS; OPTICAL CONSTANTS; OPTICAL FILMS; PHYSICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SEMICONDUCTOR DOPING; X RAY DIFFRACTION; ZINC OXIDE;

CR-DOPED; CR-DOPING; CRYSTALLINE THIN FILMS; DOPED ZNO; DOPED ZNO THIN FILMS; DOPING CONCENTRATION; REACTIVE ELECTRON BEAM EVAPORATION; STRUCTURAL AND OPTICAL PROPERTIES; THIN-FILMS; ZNO THIN FILM;

THIN FILMS;

EID: 84874004088     PISSN: 10020071     EISSN: 17455391     Source Type: Journal    
DOI: 10.1016/j.pnsc.2013.01.010     Document Type: Article

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