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Volumn 284-287, Issue , 2013, Pages 347-351

Study of zinc oxide films on SiO2/Si substrate by sol-gel spin coating method for pH measurement

Author keywords

IDE; PH; Sol gel; Zinc oxide

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CRYSTALLINITIES; DEPOSITED ZINCS; DIELECTRIC ANALYZERS; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; IDE; NEUTRAL PH; PH MEASUREMENTS; REAL TIME; SOL-GEL SPIN COATING METHOD; VARIOUS PH; ZINC OXIDE THIN FILMS;

EID: 84873937296     PISSN: 16609336     EISSN: 16627482     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMM.284-287.347     Document Type: Conference Paper
Times cited : (15)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.