Highly visible-light reflective SiOxNy nanowires for bright-white reflector applications

Thin Solid Films

Volumn 529, Issue , 2013, Pages 115-118

  Xi, Shuang ^a   Shi, Tielin ^a   Zhang, Lei ^b   Liu, Dan ^a   Lai, Wuxing ^a   Tang, Zirong ^b  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Bright whiteness; Diffuse reflection; Reflector; SiOxNy nanowire

Indexed keywords

BRIGHT WHITENESS; COATING MATERIAL; CUP SURFACE; DIFFUSE REFLECTION; DIFFUSE REFLECTIVITY; HIGH TEMPERATURE; LIGHTING EFFICIENCY; OPTICAL STABILITY; REFLECTOR; SILICON SUBSTRATES; SINGLE CRYSTAL SILICON; SINGLE CRYSTALLINE NANOWIRES; TRAPPED MODES; VAPOR SOLID MECHANISM; VISIBLE LIGHT; VISIBLE WAVELENGTHS; WAVELENGTH RANGES; WHITE LIGHT EMITTING DIODES;

LIGHT EMITTING DIODES; REFLECTION; SILICON NITRIDE; SILICON OXIDES; VAPORS;

NANOWIRES;

EID: 84873718833     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.07.077     Document Type: Conference Paper

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