Effects of ruthenium seed layer on the microstructure and spin dynamics of thin permalloy films

Journal of Applied Physics

Volumn 113, Issue 5, 2013, Pages

  Jin, Lichuan ^a   Zhang, Huaiwu ^a   Tang, Xiaoli ^a   Bai, Feiming ^a   Zhong, Zhiyong ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DAMPING CONSTANTS; DYNAMIC PROPERTY; LINEWIDTH BROADENING; MAGNETIZATION PROPERTY; MICROSTRUCTURE PROPERTIES; SEED LAYER; SEED LAYER THICKNESS; SPIN CURRENTS; STRUCTURE PROPERTY; SURFACE ANISOTROPY; THIN PERMALLOY FILMS;

MICROSTRUCTURE; NICKEL; NICKEL ALLOYS; SPIN DYNAMICS;

RUTHENIUM;

EID: 84873672893     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4790133     Document Type: Article

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