Ferromagnetic resonance study of thickness-dependent magnetization precession in Ni80 Fe20 films

Journal of Applied Physics

Volumn 101, Issue 9, 2007, Pages

  Chen, Yi Chun ^a,b   Hung, Dung Shing ^c,d   Yao, Yeong Der ^a,e   Lee, Shang Fan ^a   Ji, Huan Pei ^a   Yu, Chwen ^a  

^a INSTITUTE OF PHYSICS   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^c MING CHUAN UNIVERSITY   (Taiwan)

^d RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

^e TATUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FREQUENCY MEASUREMENT; FERROMAGNETIC RESONANCE; FILM THICKNESS; METALLIC FILMS; SATURATION MAGNETIZATION;

PERMALLOY FILMS; SCANNING FREQUENCY;

NICKEL ALLOYS;

EID: 34248570799     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2711072     Document Type: Conference Paper

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