Ferromagnetic resonance linewidth in metallic thin films: Comparison of measurement methods

Journal of Applied Physics

Volumn 99, Issue 9, 2006, Pages

  Kalarickal, Sangita S ^a   Krivosik, Pavol ^a,d   Wu, Mingzhong ^a   Patton, Carl E ^a   Schneider, Michael L ^b   Kabos, Pavel ^b   Silva, T J ^b   Nibarger, John P ^c  

^a Department of Environmental and Radiological Health Sciences   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c SUN MICROSYSTEMS   (United States)

^d SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

LINEWIDTH; PULSED INDUCTIVE MICROWAVE MAGNETOMETER (PIMM) TECHNIQUES; VECTOR NETWORK ANALYZER (VNA);

DAMPING; FREQUENCY RESPONSE; MAGNETOMETERS; MICROWAVES; THIN FILMS;

FERROMAGNETIC RESONANCE;

EID: 33646875329     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2197087     Document Type: Article

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