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Volumn 3, Issue 10, 2013, Pages 3316-3324
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The structure and mass of heterogeneous thin films measured with dual polarization interferometry and ellipsometry
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYSIS OF DATA;
ANALYTIC FORMULA;
CATIONIC POLYELECTROLYTE;
DENSITY DISTRIBUTIONS;
DENSITY PROFILE;
DUAL POLARIZATION INTERFEROMETRY;
EXTINCTION COEFFICIENTS;
FRESNEL;
INFORMATION CONCERNING;
ISOTROPIC MODELS;
LIGHT-ABSORBING FILMS;
MEASURED VALUES;
MOLECULAR SPECIES;
NON-UNIFORM DENSITY;
OPTICAL TECHNIQUE;
OPTICAL WAVEGUIDE LIGHTMODE SPECTROSCOPY;
OPTICAL WAVEGUIDE TECHNIQUES;
POLYETHYLENIMINES;
QUARTZ CRYSTAL MICROBALANCE WITH DISSIPATION;
SINGLE-LAYER MODELS;
SLAB MODEL;
COMPOSITE FILMS;
ELLIPSOMETRY;
MAXWELL EQUATIONS;
MOLECULAR STRUCTURE;
OPTICAL WAVEGUIDES;
REFRACTIVE INDEX;
SILICA;
THIN FILMS;
VAPOR DEPOSITION;
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EID: 84873669550
PISSN: None
EISSN: 20462069
Source Type: Journal
DOI: 10.1039/c2ra22911k Document Type: Article |
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Times cited : (16)
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References (32)
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