Multiple path length dual polarization interferometry

Optics Express

Volumn 17, Issue 13, 2009, Pages 10959-10969

  Coffey, Paul D ^a   Swann, Marcus J ^b   Waigh, Thomas A ^a   Schedin, Fred ^a   Lu, Jian R ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b Farfield Group   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; POLARIZATION; REFRACTIVE INDEX;

ADSORBED LAYERS; DUAL POLARIZATION INTERFEROMETRY; DUAL-POLARIZATIONS; HUMAN SERUM ALBUMINS; IN-SITU MEASUREMENT; LAYER THICKNESS; ULTRATHIN LAYERS; WAVEGUIDE CONFIGURATIONS;

ULTRATHIN FILMS;

GLASS FIBER; POLY(METHYL METHACRYLATE); SERUM ALBUMIN; SILICON;

ADSORPTION; ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; EQUIPMENT DESIGN; GENETIC PROCEDURES; HUMAN; INSTRUMENTATION; INTERFEROMETRY; METHODOLOGY; OPTICS; RADIATION SCATTERING; SURFACE PLASMON RESONANCE;

ADSORPTION; BIOSENSING TECHNIQUES; ELECTROCHEMISTRY; EQUIPMENT DESIGN; HUMANS; INTERFEROMETRY; OPTICAL FIBERS; OPTICS AND PHOTONICS; POLYMETHYL METHACRYLATE; SCATTERING, RADIATION; SERUM ALBUMIN; SILICON; SURFACE PLASMON RESONANCE;

EID: 67649252839     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.010959     Document Type: Article

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