Extended X-ray absorption fine structure study of Gd doped ZrO2 systems

Journal of Applied Physics

Volumn 113, Issue 4, 2013, Pages

  Basu, S ^a   Varma, Salil ^a   Shirsat, A N ^a   Wani, B N ^a   Bharadwaj, S R ^a   Chakrabarti, Aparna ^b   Jha, S N ^a   Bhattacharyya, D ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

^b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO; BOND DISTANCE; COORDINATION NUMBER; DISORDER PARAMETERS; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; EXTENDED XRAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPIES; FIRST PRINCIPLE CALCULATIONS; GD DOPED; HIGH CONDUCTIVITY; HIGH-TEMPERATURE SINTERING; LOCAL STRUCTURE; POTENTIAL APPLICATIONS;

ABSORPTION SPECTRA; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; OXYGEN VACANCIES; ZIRCONIUM; ZIRCONIUM ALLOYS;

GADOLINIUM;

EID: 84873651431     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4788823     Document Type: Article

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