X-ray absorption spectroscopy of doped ZrO 2 systems

Journal of Applied Physics

Volumn 111, Issue 5, 2012, Pages

  Basu, S ^a   Varma, Salil ^a   Shirsat, A N ^a   Wani, B N ^a   Bharadwaj, S R ^a   Chakrabarti, A ^b   Jha, S N ^a   Bhattacharyya, D ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

^b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BOND DISTANCE; DISORDER PARAMETERS; EXAFS DATA; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FIRST PRINCIPLE CALCULATIONS; HIGH CONDUCTIVITY; IONIC RADIUS; LA DOPING; LOCAL STRUCTURE; POTENTIAL APPLICATIONS; X-RAY SOURCES; XRD SPECTRA;

DOPING (ADDITIVES); EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; GADOLINIUM; SINTERING; X RAY ABSORPTION SPECTROSCOPY; X RAY DIFFRACTION; ZIRCONIUM ALLOYS;

ZIRCONIUM;

EID: 84858965259     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3693470     Document Type: Article

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