First results from a dispersive EXAFS beamline developed at INDUS-2 synchrotron source at RRCAT, Indore, India

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 609, Issue 2-3, 2009, Pages 286-293

  Bhattacharyya, D ^a   Poswal, A K ^a   Jha, S N ^a   Sangeeta, ^a   Sabharwal, S C ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Bi2O3; Dispersive EXAFS; Pb5Ge3O11; PbO; Synchrotron beamline

Indexed keywords

BEAM LINES; BENDING MAGNETS; BENT CRYSTALS; CCD DETECTORS; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; OXIDE POWDER; POSITION SENSITIVE; SIMULTANEOUS MEASUREMENT; SYNCHROTRON BEAMLINES; SYNCHROTRON SOURCE; X-RAY ABSORPTION SPECTRUM;

ABSORPTION; BOND LENGTH; CRYSTAL STRUCTURE; GERMANIUM; LIGHT ABSORPTION; METAL FOIL; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY ABSORPTION;

LEAD;

EID: 71749094941     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.07.098     Document Type: Article

References (42)

1. In: Konigsberger D.C., and Prince R. (Eds). X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES (1988), Wiley, New York
2. Lytle F.W. J. Synchrotron Radiat. 6 (1999) 123
3. Stern E.A. J. Synchrotron Radiat. 8 (2001) 49
4. Tournus F., Masenelli B., Melinon P., Blasé X., Perez A., Pellkarin M., Broyer M., Flank A.M., and Lagarde P. Phys. Rev. B 65 (2002) 165417
5. Hricovini K., Padova P.D., Quaresima C., Perfetti P., Brochier R., Richter C., Ilakovac V., Heckmann P., Lechevallier L., Bencok P., Fevre P.L., and Teodorescu C. Appl. Surf. Sci. 212-213 (2003) 17
6. Ascone I., Fourme R., and Hasnain S. J. Synchrotron Radiat. 10 (2003) 16
7. Lee P.A., Citrin P.H., Eisenberger P., and Kincaid B.M. Rev. Mod. Phys. 53 (1981) 769
8. Sayers D.E., Stern E.A., and Lytle F.W. Phys. Rev. Lett. 27 (1971) 1204
9. Pearce C.I., Coker V.S., Charnock J.M., Pattrick R.A.D., Mosselmans J.F.W., Law N., Beveridge T.J., and Lloyd J.R. Nanotechnology 19 (2008) 13
10. T. Mori, M. Nomura, M. Sato, H. Adachi, Y. Uchida, A. Toyoshima, S. Yamamoto, K. Tsuchiya, T. Shioya, H. Kawata, in: Proceedings of the eighth International Conference on Synchrotron Radiation Instrumentation, San Fransisco, USA, 25-29 August 2003; AIP Conf. Proc. 705 (2003) 255.
11. Iwata Y., Koizumi H., Koyano N., Shibuya I., and Nizeki N. J. Phys. Soc. Jpn. 35 (1973) 314
12. Newnham R.E., Wolfe R.W., and Darlington C.N.W. J. Sol. State Chem. 6 (1973) 378n
13. James R.W. The Optical Principle of the Diffraction of X-rays, G. Bell & Sons, London, 1948. Acta Crystallogr. 3 (1950) 80
14. Lemonmer M., Fourme R., Rousseaux F., and Kahn R. Nucl. Instr. and Meth. 152 (1978) 173
15. SHADOW GUI, version 1.1.0, 1997, 〈http://www.X-raylith.wisc.edu/shadow/GUI〉.
16. Mills D.M., Henderson C., and Batterman B.W. Nucl. Instr. and Meth. A 246 (1986) 356
17. Flank A.M., Fontaine A., Jucha A., Lemonnier M., Raoux D., and Williams C. Nucl. Instr. and Meth. 208 (1983) 651
18. Tolentino H., Baudelet F., Dartyge E., Fontaine A., Lena A., and Tourillon G. Nucl. Instr. and Meth. A 289 (1990) 307
19. Lee P.L., Beno M.A., Jennings G., Ramanathan M., Knapp G.S., Huang K., Bai J., and Montano P.A. Rev. Sci. Instrum. 65 (1994) 1
20. Sparks C.J., Ice G.E., Wong J., and Batterman B.W. Nucl. Instr. and Meth. 194 (1982) 73
21. Stephens P.W., Eng P.J., and Tse T. Rev. Sci. Instrum. 64 (1993) 374
22. Artemev A., Artemiev N., Busetto E., Franc F., Hardy J., Mraźek D., and Savoia A. Nucl. Instr. and Meth. A 467-468 (2001) 377
23. Technical Report on Synchrotron Radiation Source INDUS-2, Centre for Advanced Technology, Indore, India, September 1998.
24. Bhattacharyya D., Jha S.N., Das N.C., Verma V., Markandeya S.G., and Ghosh A.K. Sadhana (India) 30 (2005) 735
25. Liu J.C., and Nelson W.R. Nucl. Instr. and Meth. A 360 (1995) 626
26. X-Ray Data Booklet. Center for X-ray Optics and Advanced Light Source (2001), Lawrence Berkeley National Laboratory, Berkley
27. N.C. Das, S.N. Jha, D. Bhattacharyya, A.K. Sinha, V.K. Mishra, V. Verma, A.K. Ghosh, Report No. E/030, BARC, Mumbai, India, 2002.
28. Newville M., Ravel B., Haskel D., Rehr J.J., Stern E.A., and Yacoby Y. Physica B 208 & 209 (1995) 154
29. Sanchez del Rio M., and Dejus R.J. SPIE 2448 (1998) 340
30. 〈http://www.esrf.fr/computing/scientific/xop〉
31. Lutzenkrichen-Hecht D., and Frahm R. J. Synchrotron Radiat. 6 (1999) 591
32. Sacerdoti M., Dalconi M.C., Carotta M.C., Cavicchi B., Ferroni M., Colonna S., and Vonad M. J. Sol. State Chem. 177 (2004) 1781
33. Malmros G. Acta Chem. Scand. 24 (1970) 384
34. Carlsson J.M., Hellsing B., Domingos H.S., and Bristowe P.D. Phys. Rev. B 65 (2002) 205122
35. Hill R.J. Acta Crystallogr. Sect. C 41 (1985) 1281
36. Berastegui P., and Hull S. J. Sol. State Chem. 150 (2000) 266
37. Iwata Y., Koizumi H., Koyano N., Shibuya I., and Nizeki N. J. Phys. Soc. Jpn. 35 (1973) 314
38. Zwicker W.K., Delfino M., Dougherty J.P., Sicignano A., Ladell J., and Nicolosi J.A. J. Electron. Mater. 6 (1977) 125
39. Wu X., Xu J., Xiao J., Wu A., and Jin W. J. Cryst. Growth 263 (2004) 208
40. Speranskaya E.I. Izv. Akad Nauk SSSR Otd. Khim. Nauk (1959) 163
41. Hasegawa H., Shimada M., and Koizumi M. J. Mater. Sci. 8 (1973) 1725
42. Nozik Yu.Z., Maksimov B.A., Fykin L.E., Dudarev V.Ya., Garashina L.S., and Gabrielyan V.T. J. Struct. Chem. 19 (1979) 628