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Volumn 400, Issue PART 4, 2012, Pages

An apparatus for measurements of thermal conductivity and thermal expansion based on GM cryocooler

Author keywords

[No Author keywords available]

Indexed keywords

COOLING; CRYOGENIC EQUIPMENT; CRYOGENICS; LOW TEMPERATURE EFFECTS; STABILITY CRITERIA; STAINLESS STEEL; STRAIN GAGES; TEMPERATURE; THERMAL EXPANSION; THERMODYNAMIC PROPERTIES;

EID: 84873648636     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/400/5/052017     Document Type: Conference Paper
Times cited : (10)

References (15)
  • 7
    • 84873652053 scopus 로고    scopus 로고
    • Wendell, Vishay Micro-Measurements Group Inc (Wendell, Vishay Micro-Measurements Group Inc.) Wendell, Vishay Micro-Measurements Group Inc.
    • Vishay Micro-Measurements Group Inc 2007 Vishay Micro-Measurements Technical Note TN-513 (Wendell, Vishay Micro-Measurements Group Inc.)
    • (2007) Vishay Micro-Measurements Technical Note TN-513
  • 14
    • 0014781887 scopus 로고
    • 10.1063/1.1684599 0034-6748
    • Host J G 1970 Rev. ScI. Instrum 41 622-4
    • (1970) Rev. ScI. Instrum , vol.41 , Issue.5 , pp. 622-624
    • Host, J.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.