Thermal variation of structure and electrical conductivity in Bi 4YbO7.5

Chemistry of Materials

Volumn 25, Issue 3, 2013, Pages 326-336

  Leszczynska, Marzena ^a   Liu, Xi ^b   Wrobel, Wojciech ^a   Malys, Marcin ^a   Krynski, Marcin ^a   Norberg, Stefan T ^c   Hull, Stephen ^d   Krok, Franciszek ^a   Abrahams, Isaac ^b  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

^c CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^d RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

ac impedance spectroscopy; bismuth oxide; bismuth ytterbium oxide; defect structure; fluorite structure; neutron diffraction; total scattering; X ray diffraction

Indexed keywords

AC IMPEDANCE SPECTROSCOPY; BISMUTH OXIDES; FLUORITE STRUCTURE; TOTAL SCATTERING; YTTERBIUM OXIDE;

DEFECT STRUCTURES; ELECTRIC CONDUCTIVITY; FLUORSPAR; NEUTRON DIFFRACTION; PHASE SEPARATION; SOLID ELECTROLYTES; SPECTROSCOPY; STOICHIOMETRY; THERMOANALYSIS; X RAY DIFFRACTION; YTTERBIUM;

IONS;

EID: 84873636410     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm302898m     Document Type: Article

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