A combined total scattering and simulation approach to analyzing defect structure in Bi3YO6

Chemistry of Materials

Volumn 22, Issue 15, 2010, Pages 4435-4445

  Abrahams, Isaac ^a   Liu, Xi ^a   Hull, Stephen ^b   Norberg, Stefan T ^b,c   Krok, Franciszek ^d   Kozanecka Szmigiel, Anna ^d   Islam, M Saiful ^e   Stokes, Stephen J ^e  

^a QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^d WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^e University of Bath   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AC IMPEDANCE SPECTROSCOPY; COORDINATION ENVIRONMENT; CRYSTALLOGRAPHIC SITES; ELECTRICAL PROPERTY; ENERGY CONFIGURATIONS; ENERGY MINIMIZATION; ENERGY MINIMIZATION METHODS; OXIDE IONS; PHYSICAL EVIDENCE; REVERSE MONTE CARLO MODELING; ROOM TEMPERATURE; SHORT-RANGE CORRELATIONS; SIMULATION APPROACH; TOTAL NEUTRON SCATTERING; TOTAL SCATTERING; VACANCY ORDERING;

ANGULAR DISTRIBUTION; DEFECTS; ELECTRIC PROPERTIES; MODELS; NEUTRON DIFFRACTION; NEUTRON SCATTERING; OPTIMIZATION; RIETVELD ANALYSIS; RIETVELD METHOD; SOLID ELECTROLYTES; STRUCTURAL ANALYSIS;

DISTRIBUTION FUNCTIONS;

EID: 77955264570     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm101130a     Document Type: Article

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