Dual-arm Z-scan technique to extract dilute solute nonlinearities from solution measurements

Optical Materials Express

Volumn 2, Issue 12, 2012, Pages 1776-1790

  Ferdinandus, Manuel R ^a   Reichert, Matthew ^a   Ensley, Trenton R ^a   Hu, Honghua ^a   Fishman, Dmitry A ^a   Webster, Scott ^a   Hagan, David J ^a   Van Stryland, Eric W ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FITTING ERROR; NON-LINEAR OPTICAL; NON-LINEAR REFRACTION; ORGANIC DYE; SQUARAINES; Z-SCAN TECHNIQUE;

SOLVENTS;

NONLINEAR OPTICS;

EID: 84873415349     PISSN: None     EISSN: 21593930     Source Type: Journal    
DOI: 10.1364/OME.2.001776     Document Type: Article

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