Surface-enhanced Raman spectroscopy as a tool for characterizing nanostructures containing molecular components

AIP Conference Proceedings

Volumn 1506, Issue 1, 2012, Pages 57-61

  Xu, Ke ^a   Abell, Justin ^b   Zhao, Yiping ^c   Qian, Jun ^a   Brenneman, Kimber ^d   Meshik, Xenia ^d   Dutta, Mitra ^a   Stroscio, Michael ^a,d  

^a University of Illinois   (United States)

^b University of Georgia   (United States)

^c UNIVERSITY OF GEORGIA   (United States)

^d University of Illinois at Chicago   (United States)

Author keywords

Molecular component; Nanostructure; Raman spectroscopy; SERS

Indexed keywords

EID: 84873146841     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.4772526     Document Type: Conference Paper

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