Atomic force microscopy surface nanocharacterization of UV-irradiated collagen thin films

IEEE 12th International Conference on BioInformatics and BioEngineering, BIBE 2012

Volumn , Issue , 2012, Pages 602-607

  Stylianou, A ^a   Yova, D ^a   Politopoulos, K ^a  

^a NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

Author keywords

Atomic Force Microscopy; Collagen; Fluorescence; Nanocharacterization; UV

Indexed keywords

AFM; AFM IMAGE; BIOLOGICAL REACTION; BIOLOGICAL SAMPLES; CHRONIC EXPOSURE; COATING PROCEDURES; CULTURE SUBSTRATE; EXTRACELLULAR MATRICES; FIBROUS STRUCTURES; HIGH-RESOLUTION IMAGING; HUMAN SKIN; NANO-CHARACTERIZATION; NANOBIOMATERIALS; NONDESTRUCTIVE CHARACTERIZATION; PROPER DESIGN; QUALITATIVE INFORMATION; ROUGHNESS AND TOPOGRAPHY; TISSUE REGENERATION; UV; UV IRRADIATION; UV RAYS;

ATOMIC FORCE MICROSCOPY; BIOINFORMATICS; BIOMATERIALS; CELL CULTURE; CLARIFIERS; COATINGS; FLUORESCENCE; INTERFACES (MATERIALS); IRRADIATION; NONDESTRUCTIVE EXAMINATION; SCAFFOLDS (BIOLOGY); SURFACE PROPERTIES; SURFACE REACTIONS; SURFACE ROUGHNESS; SURFACES; THIN FILMS; TISSUE;

COLLAGEN;

EID: 84872857081     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/BIBE.2012.6399741     Document Type: Conference Paper

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