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Physica B: Condensed Matter

Volumn 411, Issue , 2013, Pages 77-80

Raman scattering study on pristine and oxidized n-type porous silicon

(2) Zhong, Furu a Jia, Zhen Hong b

a SHIHEZI UNIVERSITY (China)

b XINJIANG UNIVERSITY (China)

Author keywords

Oxidation; Porous silicon; Raman; Scanning electron microscope (SEM)

Indexed keywords

CRYSTALLINE SILICONS; PEAK INTENSITY; RAMAN; RAMAN ANALYSIS; THERMAL OXIDATION;

POROUS SILICON; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SILICON;

OXIDATION;

EID: 84872788533 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/j.physb.2012.09.061 Document Type: Article

Times cited : (24)

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