Rapid reversible electromigration of intercalated K ions within individual MoO3 nanobundle

Journal of Applied Physics

Volumn 113, Issue 2, 2013, Pages

  Hu, Zhibin ^a   Zhou, Chenggang ^b   Ramanujam Prabhakar, Rajiv ^c   Xiaodai Lim, Sharon ^d   Wang, Yinghui ^a   Van Kan, Jeroen A ^a   Cheng, Hansong ^a   Mhaisalkar, Subodh G ^c,e   Sow, Chorng Haur ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b CHINA UNIVERSITY OF GEOSCIENCES   (China)

^c NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^d NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^e NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED CURRENT; HIGH CURRENT DENSITIES; ION MOVEMENTS; SINGLE-CRYSTALLINE; STRUCTURAL DAMAGES;

ELECTROMIGRATION; MOLYBDENUM OXIDE;

IONS;

EID: 84872731928     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4774244     Document Type: Article

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