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Volumn 215, Issue , 2013, Pages 485-492
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Microstructure development during NiAl intermetallic synthesis in reactive Ni-Al nanolayers: Numerical investigations vs. TEM observations
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Author keywords
Energetic materials; Interfaces; Intermetallics; Molecular dynamics; Multilayer thin films; Nanoscale effects
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Indexed keywords
EMBEDDED-ATOM METHOD POTENTIALS;
HETEROGENEOUS REACTIONS;
INTERMETALLIC PHASE;
MICROSTRUCTURE DEVELOPMENT;
MOLECULAR DYNAMICS SIMULATIONS;
MULTI-LAYER SYSTEM;
MULTI-LAYER THIN FILM;
NANO LAYERS;
NANOMETRICS;
NANOSCALE EFFECTS;
NI-AL INTERMETALLICS;
NUCLEATION AND GROWTH;
NUMERICAL INVESTIGATIONS;
RATIONAL DESIGN;
REACTIVE PROCESS;
TEM OBSERVATIONS;
TYPICAL MORPHOLOGY;
ALUMINUM;
EXPLOSIVES;
INTERFACES (MATERIALS);
MOLECULAR DYNAMICS;
MULTILAYERS;
NUMERICAL METHODS;
REACTION KINETICS;
INTERMETALLICS;
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EID: 84872678475
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2012.09.065 Document Type: Article |
Times cited : (43)
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References (24)
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