Relaxor-like dielectric behavior in stoichiometric sillenite Bi 12SiO20

Chemistry of Materials

Volumn 25, Issue 1, 2013, Pages 48-54

  Hu, Yu ^a   Sinclair, Derek C ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Bi based relaxors; impedance spectroscopy; Raman spectroscopy; sillenites

Indexed keywords

BI-BASED OXIDES; DIELECTRIC BEHAVIOR; DIELECTRIC MEASUREMENTS; FIXED FREQUENCY; IMPEDANCE SPECTROSCOPY; LONE PAIR; RELAXORS; SILLENITES; SPACE GROUPS; TEMPERATURE RANGE; VARIABLE TEMPERATURE;

CHEMISTRY; MATERIALS SCIENCE;

RAMAN SPECTROSCOPY;

EID: 84872154797     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm3031363     Document Type: Conference Paper

References (30)

1. Radaev, S. F.; Simonov, V. I.; Kargin, Y. F. Acta Crystallogr. B 1992, 48, 604-609
2. Radaev, S. F.; Simonov, V. I. Kristallografiya 1992, 37 (4) 484-499
3. Shannon, R. D. Acta Crystallogr. A 1976, 32, 751-767
4. Sillen, L. G. Ark. Kemi Mineral. Geol. 1937, 12A, 1-13
5. Levin, E. M.; Roth, R. S. J. Res. Natl. Bur. Stand., Sect. A 1964, 68 (2) 197-206
6. Abrahams, S. C.; Jamieson, P. B.; Bernstei, J. L. J. Chem. Phys. 1967, 47 (10) 4034-4041
7. Burkov, V. I.; Gorelik, V. S.; Egorysheva, A. V.; Kargin, Y. F. J. Russ. Laser Res. 2001, 22 (3) 243-267
8. Valant, M.; Suvorov, D. Chem. Mater. 2002, 14 (8) 3471-3476
9. Levin, E. M.; Mcdaniel, C. L. J. Am. Ceram. Soc. 1962, 45 (8) 355-360
10. Aldrich, R. E.; Hou, S. L.; Harvill, M. L. J. Appl. Phys. 1971, 42 (1) 493-494
11. Mitsuyu, T.; Wasa, K.; Hayakawa, S. J. Electrochem. Soc. 1976, 123 (1) 94-96
12. Papazoglou, D. G.; Apostolidis, A. G.; Vanidhis, E. D. Appl. Phys. B: Laser Opt. 1997, 65 (4-5) 499-503
13. Valant, M.; Suvorov, D. J. Am. Ceram. Soc. 2001, 84 (12) 2900-2904
14. Sebastian, M. T.; Jantunen, H. Int. Mater. Rev. 2008, 53 (2) 57-90
15. Valant, M.; Suvorov, D. J. Am. Ceram. Soc. 2002, 85 (2) 355-358
16. Lee, S. L.; Lee, C. K.; Sinclair, D. C. Solid State Ionics 2005, 176 (3-4) 393-400
17. Mihailova, B.; Gospodinov, M.; Konstantinov, L. J. Phys. Chem. Solids 1999, 60 (11) 1821-1827
18. Fu, S.; Ozoe, H. J. Phys. D: Appl. Phys. 1996, 29, 2032-2043
19. Irvine, J. T. S.; Sinclair, D. C.; West, A. R. Adv. Mater. 1990, 2, 132-138
20. Macdonald, J. R.; Barsoukov, E. Impedance Spectroscopy: Theory, Experiment, and Applications, 2 nd ed.; John Wiley & Sons: New York, 1987; pp 18, 37-41.
21. Valant, M.; Suvorov, D. J. Am. Ceram. Soc. 2004, 87 (6) 1056-1061
22. Moulson, A. J.; Herbert, J. M. Electroceramics: Materials, Properties, Applications, 2nd Edition; John Wiley & Sons Ltd.: Chichester, England, 2003; pp 52-56.
23. Ye, Z. G. Key Eng. Mater. 1998, 155-156, 81-122
24. Hochli, U. T.; Knorr, K.; Loidl, A. Adv. Phys. 1990, 39 (5) 405-615
25. Li, M.; Sinclair, D. C.; West, A. R. J. Appl. Phys. 2011, 109 (8) 084106
26. Tan, C. C.; Feteira, A.; Sinclair, D. C. Chem. Mater. 2012, 24 (12) 2247-2249
27. Bing, Y.-H.; Bokov, A. A.; Ye, Z.-G.; Noheda, B.; Shirane, G. J. Phys.: Condens. Matter. 2005, 17, 2493-2507
28. Valant, M.; Davies, P. K. J. Mater. Sci. 1999, 34 (22) 5437-5442
29. Kamba, S.; Porokhonskyy, V.; Pashkin, A.; Bovtun, V.; Petzelt, J.; Nino, J. C.; Trolier-McKinstry, S.; Lanagan, M. T.; Randall, C. A. Phys. Rev. B 2002, 66 (5) 054106
30. Osman, R. A. M.; West, A. R. J. Appl. Phys. 2011, 109 (7) 074106