Synthesis and characterization of a new sillenite compound - Bi12(B0.5P0.5)O20

Journal of the American Ceramic Society

Volumn 85, Issue 2, 2002, Pages 355-358

  Valant, Matjaz ^a,b   Suvorov, Danilo ^a,b  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSTRUCTURE; NATURAL FREQUENCIES; PERMITTIVITY; STOICHIOMETRY; SYNTHESIS (CHEMICAL); THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

SOLID-STATE REACTIONS;

BISMUTH COMPOUNDS;

EID: 0036479151     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2002.tb00096.x     Document Type: Article

References (18)

1. 20
2. 40 (M = Si, Ge, V, As, P)
3. Structures of sillenite and atomic mechanisms of their isomorphic substitution
4. 60
5. 19
6. 20
7. 20
8. 20 films
9. 20 thin films grown by electron cyclotron resonance plasma sputtering with Bi and Si
10. 20
11. Investigations of sillenite-type single crystals at high frequencies
12. Temperature variation of the dielectric properties of bismuth germanate and bismuth germanium oxide
13. 20 single crystals
14. Q-Factor measurement with network analyzer
15. Revised effective ionic radii and systematic studies of interatomic distances in halides and chalcogenides