A new dissimilarity measure for comparing labeled graphs

Linear Algebra and Its Applications

Volumn 438, Issue 5, 2013, Pages 2331-2338

  Wicker, Nicolas ^a   Nguyen, Canh Hao ^b   Mamitsuka, Hiroshi ^b  

^a UNIV LILLE   (France)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

Graph Laplacian; Labeled graph dissimilarity; Spectral graph comparison

Indexed keywords

DISSIMILARITY MEASURES; EIGEN DECOMPOSITION; EIGENVALUES; GRAPH ANALYSIS; GRAPH LAPLACIAN; GRAPH LAPLACIANS; GRAPH STRUCTURES; LABELED GRAPHS; SPECTRAL GRAPH COMPARISON; SPECTRAL GRAPH THEORY;

EIGENVALUES AND EIGENFUNCTIONS; SPECTRUM ANALYSIS;

GRAPH THEORY;

EID: 84872101681     PISSN: 00243795     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.laa.2012.10.021     Document Type: Article

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