A graph distance metric based on the maximal common subgraph

Pattern Recognition Letters

Volumn 19, Issue 3-4, 1998, Pages 255-259

  Bunke, Horst ^a   Shearer, Kim ^b  

^a UNIVERSITY OF BERN   (Switzerland)

^b CURTIN UNIVERSITY   (Australia)

Author keywords

Distance measure; Error tolerant graph matching; Graph edit distance; Maximal common subgraph; Metric

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; ERROR ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; GRAPH THEORY;

ERROR TOLERANT GRAPH MATCHING; GRAPH EDIT DISTANCE; MAXIMAL COMMON SUBGRAPHS;

PATTERN RECOGNITION;

EID: 0032024433     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(97)00179-7     Document Type: Article

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