A graph distance metric combining maximum common subgraph and minimum common supergraph

Pattern Recognition Letters

Volumn 22, Issue 6-7, 2001, Pages 753-758

  Fernández, Mirtha Lina ^a   Valiente, Gabriel ^b  

^a UNIVERSIDAD DE ORIENTE   (Cuba)

^b UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

Attributed relational graph; Error correcting graph matching; Graph edit distance; Maximum common subgraph; Minimum common supergraph; Optimal graph matching; Subgraph isomorphism

Indexed keywords

ALGORITHMS; ERROR CORRECTION; FUNCTIONS; IMAGE ANALYSIS; IMAGE QUALITY;

RELATIONAL GRAPH MATCHING;

PATTERN MATCHING;

ALGORITHM; GRAPHICAL METHOD; PATTERN RECOGNITION;

EID: 0035339250     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(01)00017-4     Document Type: Article

References (11)

1. On a relation between graph edit distance and maximum common subgraph
2. Error-correcting graph matching: On the influence of the underlying cost function
3. Inexact graph matching for structural pattern recognition
4. A graph distance metric based on the maximal common subgraph
5. A graduated assignment algorithm for graph matching
6. A note on the derivation of maximal common subgraphs of two directed or undirected graphs
7. Backtrack search algorithms and the maximal common subgraph problem
8. A new algorithm for error-tolerant subgraph isomorphism detection
9. Structural descriptions and inexact matching
10. Error-correcting isomorphism of attributed relational graphs for pattern analysis
11. An algorithm for the largest common subgraph isomorphism using the implicit net