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Volumn 25, Issue 4, 2013, Pages

Structural and compositional characterization of ultrathin titanium oxide films grown on Pt3Ti(111)

(6) Moal, Séverine Le a,b Moors, Marco a,c Essen, Jan Markus a Breinlich, Christian a Becker, Conrad a,d Wandelt, Klaus a

a UNIVERSITY OF BONN (Germany)

b UNIVERSITÉ PARIS SUD (France)

c FORSCHUNGSZENTRUM JÜLICH (Germany)

d AIX MARSEILLE UNIVERSITÉ (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ORDER; COMPOSITIONAL CHARACTERIZATION; HEXAGONAL STRUCTURES; HIGH-RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; METASTABLE STRUCTURES; OXIDATION PARAMETERS; OXIDATION TEMPERATURE; OXIDE GROWTH; OXIDE STRUCTURES; OXYGEN ATMOSPHERE; OXYGEN EXPOSURE; PHONON STRUCTURES; PREPARATION CONDITIONS; PT(111); RECTANGULAR STRUCTURE; STABLE OXIDES; STOICHIOMETRIC PHASIS; TIO; ULTRA-THIN; VALENCE BAND SPECTRA;

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; LOW ENERGY ELECTRON DIFFRACTION; METASTABLE PHASES; OXIDATION; OXIDE FILMS; OXYGEN; PLATINUM; PLATINUM ALLOYS; REACTION INTERMEDIATES; SURFACE SEGREGATION; TITANIUM; TITANIUM OXIDES; ULTRATHIN FILMS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

FILM PREPARATION;

EID: 84872082607 PISSN: 09538984 EISSN: 1361648X Source Type: Journal
DOI: 10.1088/0953-8984/25/4/045013 Document Type: Article

Times cited : (13)

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